Home
Store
Products
Atomic Force Microscopes
easyScan 2 AFM & STM
Nanite Automated AFM
Desktop SEM
3D Optical Microscope
Carbon Nanotube Synthesis
Manipulation & Sensing
AFM Probes
Dynamic & Tapping mode
Contact Mode
Force Modulation mode
Magnetic Force Mode
Electrostatic Force Mode
Biological and Fluid Imaging
High Aspect Ratio
SuperSharp - High resolution
Critical Dimension
Tipless AFM cantilevers
Wear Resistant probes
SPM Analysis Software
PLL Detector & Controller
Vibration Isolation
SPM supplies
AFM & STM Samples
Thiols / Chemicals
Services
Applications
Education
Research
Industry
Education
Support
Contact
About Us
News
Jobs
Trimos TR Scan
Overview
Features
Software
Specifications
DHM Technology
Applications
Back to
All Products
Request a brochure and pricing information:
TR Scan Applications
Noncontact 3D Surface roughness analysis
The TR Scan checking the surface roughness of a precision sleeve
The TR Scan imaging a mirror-polished surface
Quick and easy positioning on the area of interest with a laser guide.
3D output of a silicon coating surface